Selvamanickam V., Galstyan E., Chen S., Jaroszynski J., Abraimov D., Bradford G., Paidpilli M., Goel C., Sarangi B.
Ключевые слова: HTS, REBCO, coated conductors, tapes, fabrication, MOCVD process, deposition setup, critical current, composition, homogeneity, Jc/B curves, experimental results
Ключевые слова: HTS, YBCO, thin films, fabrication, deposition setup, targets, new, electron beam evaporation, pulsed operation, substrates, temperature dependence, X-ray diffraction, microstructure
Ключевые слова: HTS, REBCO, films, fabrication, precursors, inkjet printing, deposition setup, modeling, numerical analysis
Ключевые слова: texture, HTS, GdYBCO, coated conductors, MOCVD process, fabrication, deposition setup, new, critical caracteristics, critical current, critical temperature, X-ray diffraction
Ключевые слова: presentation, magnets, HTS, REBCO, coated conductors, deposition setup, measurement setup, long conductors, uniformity, critical caracteristics, critical current, angular dependence, magnetic field dependence, temperature dependence, measurement technique, mechanical properties, tensile tests, stress effects, strain effects, laminations, thickness dependence, width
Ключевые слова: HTS, YBCO, coated conductors, fabrication, MOCVD process, precursors, heat treatment, deposition setup, microstructure, X-ray diffraction, texture
Broggi F., Chiuchiolo A., Dhalle M., Durante M., Fazilleau P., Fleiter J., Gao P., Goldacker W., Kario A., Kirby G., Haro E., Himbele J., Lorin C., Nugteren J.v., Petrone C., Rijk G.d., Ruuskanen J., Senatore C., Statera M., Stenvall A., Tixador P., Yang Y., Usoskin A., Zangenberg N.*10, Murtomaki J., Rossi L., Badel A., Bajas H., Bajko M., Ballarino A., Barth C., Betz U., Bottura L.
Ключевые слова: accelerator magnets, high field magnets, magnets dipole, modeling, numerical analysis, review, plans, HTS, coated conductors, REBCO, Roebel conductors, stacked blocks, coils model, YBCO, PLD process, IBAD process, critical caracteristics, critical current density, deposition setup, uniformity, critical current, ac losses, quench current, temperature dependence, test results
Puig T., Palau A., Obradors X., Usoskin A., Vlad R., Vilardell M., Calleja A., Fornell J., Sort J., Fernandez J.C., Puig J.
Ключевые слова: HTS, YBCO, films epitaxial, texture, microstructure, CVD process, MOCVD process, deposition setup, fabrication
Ключевые слова: HTS, coated conductors, deposition setup, MOCVD process, IBAD process, substrate Hastelloy, fabrication, texture, critical caracteristics, REBCO
Ключевые слова: PLD process, deposition setup, thin films, magnetic field dependence
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